Atom Probe Tomography: Applications and Techniques

Atom Probe Tomography (APT) is the highest spatial resolution analytical characterization technique with high efficiency single atom detection for quantitative atomic scale 3D elemental mapping of chemical heterogeneities. Learn more about this technique and how it may be applied to your research at this event.

Agenda Topics:

Atom Probe Tomography (APT): Operational Theory
Introduction to APT Data Reduction
Introduction to APT Sample Preparation
APT Applications

  • Metals: Integration with Advanced Modeling
  • Ceramics, high performance materials
  • Semiconductor Devices: Planar and finFET, LED Devices, III/V
  • Geological Materials and Biominerals

Correlative synergy

  • t-EBSD
  • TEM
  • EPMA

Atom Probe Tomography Instrumentation

Lunch will be provided.

Attendance is free of charge but space is limited!
To register, please complete the registration form by August 8th 2017
Register Here

Event Details

Date/Time:

  • Tuesday, August 15, 2017
    11:45 am - 1:15 pm
Location: Marcus Nanotechnology Building | 345 Ferst Drive | Atlanta GA | 30332
Phone: (404) 894-5100
Email: info@ien.gatech.edu
Fee(s): N/A

For More Information Contact

Eric Woods - Georgia Tech: Institute for Electronics and Nanotechnology & Materials Characterization Facility
eric,woods@ien.gatech.edu
404.385.2877